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dc.date.accessioned2020-05-16T17:53:13Z
dc.date.available2020-05-16T17:53:13Z
dc.date.created2019-07-26T13:49:34Z
dc.date.issued2019
dc.identifier.citationPonthus, Nicolas Scheibert, Julien Thøgersen, Kjetil Malthe-Sørenssen, Anders Perret-Liaudet, Joel . Statistics of the separation between sliding rigid rough surfaces: Simulations and extreme value theory approach. Physical review. E. 2019, 99(2)
dc.identifier.urihttp://hdl.handle.net/10852/75779
dc.description.abstractWhen a rigid rough solid slides on a rigid rough surface, it experiences a random motion in the direction normal to the average contact plane. Here, through simulations of the separation at single-point contact between self-affine topographies, we characterize the statistical and spectral properties of this normal motion. In particular, its rms amplitude is much smaller than that of the equivalent roughness of the two topographies and depends on the ratio of the slider's lateral size over a characteristic wavelength of the topography. In addition, due to the nonlinearity of the sliding contact process, the normal motion's spectrum contains wavelengths smaller than the smallest wavelength present in the underlying topographies. We show that the statistical properties of the normal motion's amplitude are well captured by a simple analytic model based on the extreme value theory framework, extending its applicability to sliding-contact-related topics.en_US
dc.languageEN
dc.publisherAmerican Physical Society
dc.titleStatistics of the separation between sliding rigid rough surfaces: Simulations and extreme value theory approachen_US
dc.typeJournal articleen_US
dc.creator.authorPonthus, Nicolas
dc.creator.authorScheibert, Julien
dc.creator.authorThøgersen, Kjetil
dc.creator.authorMalthe-Sørenssen, Anders
dc.creator.authorPerret-Liaudet, Joel
cristin.unitcode185,15,22,20
cristin.unitnameGEO Physics of Geological processes
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1712901
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Physical review. E&rft.volume=99&rft.spage=&rft.date=2019
dc.identifier.jtitlePhysical review. E
dc.identifier.volume99
dc.identifier.issue2
dc.identifier.doihttps://doi.org/10.1103/PhysRevE.99.023004
dc.identifier.urnURN:NBN:no-78874
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn2470-0045
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/75779/2/PhysRevE.99.023004-1.pdf
dc.type.versionPublishedVersion
cristin.articleid023004


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