Imaging defect complexes in scanning transmission electron microscopy: Impact of depth, structural relaxation, and temperature investigated by simulations
Journal article; PublishedVersion; Peer reviewed
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Year
2020Permanent link
http://urn.nb.no/CRIStin
1749627Metadata
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- Fysisk institutt [3666]
- Det matematisk-naturvitenskapelige fakultet [832]
- CRIStin høstingsarkiv [31245]