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dc.date.accessioned2018-09-11T11:59:34Z
dc.date.available2019-04-13T22:47:44Z
dc.date.created2018-04-28T08:15:38Z
dc.date.issued2018
dc.identifier.citationGranerød, Cecilie Skjold Galeckas, Augustinas Johansen, Klaus Magnus H Vines, Lasse Prytz, Øystein . The temperature-dependency of the optical band gap of ZnO measured by electron energy-loss spectroscopy in a scanning transmission electron microscope. Journal of Applied Physics. 2018, 123
dc.identifier.urihttp://hdl.handle.net/10852/64617
dc.description.abstractThe optical band gap of ZnO has been measured as a function of temperature using Electron Energy-Loss Spectroscopy (EELS) in a (Scanning) Transmission Electron Microscope ((S)TEM) from approximately 100 K up towards 1000 K. The band gap narrowing shows a close to linear dependency for temperatures above 250 K and is accurately described by Varshni, Bose-Einstein, Pässler and Manoogian-Woolley models. Additionally, the measured band gap is compared with both optical absorption measurements and photoluminescence data. STEM-EELS is here shown to be a viable technique to measure optical band gaps at elevated temperatures, with an available temperature range up to 1500 K and the benefit of superior spatial resolution. © 2018 AIP Publishingen_US
dc.languageEN
dc.publisherAmerican Institute of Physics (AIP)
dc.titleThe temperature-dependency of the optical band gap of ZnO measured by electron energy-loss spectroscopy in a scanning transmission electron microscopeen_US
dc.typeJournal articleen_US
dc.creator.authorGranerød, Cecilie Skjold
dc.creator.authorGaleckas, Augustinas
dc.creator.authorJohansen, Klaus Magnus H
dc.creator.authorVines, Lasse
dc.creator.authorPrytz, Øystein
cristin.unitcode185,15,0,0
cristin.unitnameDet matematisk-naturvitenskapelige fakultet
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1
dc.identifier.cristin1582259
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Applied Physics&rft.volume=123&rft.spage=&rft.date=2018
dc.identifier.jtitleJournal of Applied Physics
dc.identifier.volume123
dc.identifier.doihttp://dx.doi.org/10.1063/1.5023316
dc.identifier.urnURN:NBN:no-67150
dc.type.documentTidsskriftartikkelen_US
dc.type.peerreviewedPeer reviewed
dc.source.issn0021-8979
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/64617/1/graner%25C3%25B8d-jap-2018.pdf
dc.type.versionPublishedVersion
cristin.articleid145111
dc.relation.projectNORTEM/197405


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