dc.date.accessioned | 2018-09-11T11:59:34Z | |
dc.date.available | 2019-04-13T22:47:44Z | |
dc.date.created | 2018-04-28T08:15:38Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | Granerød, Cecilie Skjold Galeckas, Augustinas Johansen, Klaus Magnus H Vines, Lasse Prytz, Øystein . The temperature-dependency of the optical band gap of ZnO measured by electron energy-loss spectroscopy in a scanning transmission electron microscope. Journal of Applied Physics. 2018, 123 | |
dc.identifier.uri | http://hdl.handle.net/10852/64617 | |
dc.description.abstract | The optical band gap of ZnO has been measured as a function of temperature using Electron Energy-Loss Spectroscopy (EELS) in a (Scanning) Transmission Electron Microscope ((S)TEM) from approximately 100 K up towards 1000 K. The band gap narrowing shows a close to linear dependency for temperatures above 250 K and is accurately described by Varshni, Bose-Einstein, Pässler and Manoogian-Woolley models. Additionally, the measured band gap is compared with both optical absorption measurements and photoluminescence data. STEM-EELS is here shown to be a viable technique to measure optical band gaps at elevated temperatures, with an available temperature range up to 1500 K and the benefit of superior spatial resolution.
© 2018 AIP Publishing | en_US |
dc.language | EN | |
dc.publisher | American Institute of Physics (AIP) | |
dc.title | The temperature-dependency of the optical band gap of ZnO measured by electron energy-loss spectroscopy in a scanning transmission electron microscope | en_US |
dc.type | Journal article | en_US |
dc.creator.author | Granerød, Cecilie Skjold | |
dc.creator.author | Galeckas, Augustinas | |
dc.creator.author | Johansen, Klaus Magnus H | |
dc.creator.author | Vines, Lasse | |
dc.creator.author | Prytz, Øystein | |
cristin.unitcode | 185,15,0,0 | |
cristin.unitname | Det matematisk-naturvitenskapelige fakultet | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |
dc.identifier.cristin | 1582259 | |
dc.identifier.bibliographiccitation | info:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Applied Physics&rft.volume=123&rft.spage=&rft.date=2018 | |
dc.identifier.jtitle | Journal of Applied Physics | |
dc.identifier.volume | 123 | |
dc.identifier.doi | http://dx.doi.org/10.1063/1.5023316 | |
dc.identifier.urn | URN:NBN:no-67150 | |
dc.type.document | Tidsskriftartikkel | en_US |
dc.type.peerreviewed | Peer reviewed | |
dc.source.issn | 0021-8979 | |
dc.identifier.fulltext | Fulltext https://www.duo.uio.no/bitstream/handle/10852/64617/1/graner%25C3%25B8d-jap-2018.pdf | |
dc.type.version | PublishedVersion | |
cristin.articleid | 145111 | |
dc.relation.project | NORTEM/197405 | |