Now showing items 1-1 of 1

  • Waldeland, Anders Ueland; Zhao, Hao; Faccipieri, J. H.; Solberg, Anne H Schistad; Gelius, Leiv-J. (Journal article / Tidsskriftartikkel / PublishedVersion; Peer reviewed, 2017)
    The common-reflection-surface (CRS) method offers a stack with higher signal-to-noise ratio at the cost of a time-consuming semblance search to obtain the stacking parameters. We have developed a fast method for extracting ...