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dc.date.accessioned2013-03-12T08:15:34Z
dc.date.available2013-03-12T08:15:34Z
dc.date.issued2007en_US
dc.date.submitted2008-04-09en_US
dc.identifier.urihttp://hdl.handle.net/10852/9867
dc.description.abstractHaving a sequence diagram specification and a computer system, we need to answer the question: Is the system compliant with the sequence diagram specification in the desired way? We present a procedure for answering this question for three variations of sequence diagrams.The procedure is independent of the choice of programming language used for the system. The semantics of sequence diagrams is denotational and based on traces. In order to answer the initial question, the procedure starts by obtaining the trace-set of the system by e.g. testing, and then transforming this into the same semantic model as that used for the sequence diagram. In addition to extending our earlier work on refinement relations for sequence diagrams, we define conformance relations relating systems to sequence diagrams. The work is split in two parts. This paper presents part 1, in which we introduce the necessary definitions for using the compliance checking procedure on sequence diagrams with underspecification and sequence diagrams with inherent nondeterminism. In part 2 [RRS07], we present the definitions for using the procedure on sequence diagrams with probabilistic choice.nor
dc.language.isoengen_US
dc.relation.ispartofResearch report http://urn.nb.no/URN:NBN:no-35645en_US
dc.relation.urihttp://urn.nb.no/URN:NBN:no-35645
dc.titleRelating computer systems to sequence diagrams with underspecification, inherent nondeterminism and probabilistic choice : Part 1en_US
dc.typeResearch reporten_US
dc.date.updated2008-04-11en_US
dc.creator.authorRunde, Ragnhild Kobroen_US
dc.creator.authorRefsdal, Atleen_US
dc.creator.authorStølen, Ketilen_US
dc.subject.nsiVDP::420en_US
dc.identifier.urnURN:NBN:no-18848en_US
dc.type.documentForskningsrapporten_US
dc.identifier.duo71854en_US
dc.identifier.bibsys080578012en_US
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/9867/1/Report346.pdf


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