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Characterization of electrical properties in ZnO and SiC; A study of semiconductor band structure by automating procedures in a Transmission Electron Microscope

Kiste, Mikael Bergedalen
Master thesis
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mikael_thesis_final.pdf (4.731Mb)
Year
2020
Permanent link
http://urn.nb.no/URN:NBN:no-84619

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  • Fysisk institutt [2350]
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