The thesis aims to explore the single events sensitivity of TMS570 microcontroller for the CubeSat application. This device is automotive with a range of features that can be used to increase the reliability of the devices in a radiation environment. To understand the sensitivity of the devices ones needs to test in the devices as close as possible to the environment, it will operate in. The decapping methods are explored in this thesis. This will be important to be able to perform heavy ions testing. In the rest of the test, we explore the sensitivity of the devices in mixed field environment CHARM.