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dc.date.accessioned2013-03-12T08:21:58Z
dc.date.available2013-03-12T08:21:58Z
dc.date.issued2011en_US
dc.date.submitted2011-06-14en_US
dc.identifier.citationKhedher, Asma. Sensitivity and robustness to model risk in L´evy and jump-diffusion setting. Doktoravhandling, University of Oslo, 2011en_US
dc.identifier.urihttp://hdl.handle.net/10852/10737
dc.language.isoengen_US
dc.titleSensitivity and robustness to model risk in L´evy and jump-diffusion settingen_US
dc.typeDoctoral thesisen_US
dc.date.updated2012-03-10en_US
dc.creator.authorKhedher, Asmaen_US
dc.subject.nsiVDP::410en_US
cristin.unitcodenullen_US
cristin.unitnameMatematikken_US
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:dissertation&rft.au=Khedher, Asma&rft.title=Sensitivity and robustness to model risk in L´evy and jump-diffusion setting&rft.inst=University of Oslo&rft.date=2011&rft.degree=Doktoravhandlingen_US
dc.identifier.urnURN:NBN:no-29149en_US
dc.type.documentDoktoravhandlingen_US
dc.identifier.duo129055en_US
dc.contributor.supervisorGiulia Di Nunno, Fred Espen Benthen_US
dc.identifier.bibsys12051737xen_US
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/10737/1/1095_Khedher_DUO.pdf


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