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dc.date.accessioned2013-03-12T08:05:36Z
dc.date.available2013-03-12T08:05:36Z
dc.date.issued2009en_US
dc.date.submitted2010-01-15en_US
dc.identifier.citationPeiravi, Ali, , Moradi, Farshad, , Wisland, Dag T, , . Leakage Tolerant, Noise Immune domino logic for circuit design in the ultra deep sub-micron CMOS technology for haigh fan-in gates. Journal of Applied Sciencesen_US
dc.identifier.urihttp://hdl.handle.net/10852/10140
dc.language.isoengen_US
dc.titleLeakage Tolerant, Noise Immune domino logic for circuit design in the ultra deep sub-micron CMOS technology for haigh fan-in gatesen_US
dc.typeJournal articleen_US
dc.date.updated2010-01-15en_US
dc.creator.authorPeiravi, Alien_US
dc.creator.authorMoradi, Farshaden_US
dc.creator.authorWisland, Dag Ten_US
dc.subject.nsiVDP::420en_US
cristin.unitcode150500en_US
cristin.unitnameInformatikken_US
dc.identifier.cristin341643en_US
dc.identifier.bibliographiccitationinfo:ofi/fmt:kev:mtx:ctx&ctx_ver=Z39.88-2004&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.jtitle=Journal of Applied Sciences&rft.volume=9&rft.spage=392en_US
dc.identifier.jtitleJournal of Applied Sciences
dc.identifier.volume9
dc.identifier.issue2
dc.identifier.startpage392
dc.identifier.endpage396
dc.identifier.doihttp://dx.doi.org/10.3923/jas.2009.392.396
dc.identifier.urnURN:NBN:no-23920en_US
dc.type.documentTidsskriftartikkelen_US
dc.identifier.duo98550en_US
dc.type.peerreviewedPeer revieweden_US
dc.identifier.fulltextFulltext https://www.duo.uio.no/bitstream/handle/10852/10140/1/art392-396.pdf
dc.type.versionPublishedVersion


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