Now showing items 1-4 of 4

  • Neuvonen, Pekka T.; Vines, Lasse; Venkatachalapathy, Vishnukanthan; Zubiaga, Asier; Tuomisto, Filip; Hallén, Anders; Svensson, Bengt G.; Kuznetsov, Andrej Yu. (Journal article / Tidsskriftartikkel / PublishedVersion; Peer reviewed, 2011)
    Secondary ion mass spectrometry (SIMS) and positron annihilation spectroscopy (PAS) have been applied to study impurity migration and open volume defect evolution in Na+ implanted hydrothermally grown ZnO samples. In ...
  • Neuvonen, Pekka T.; Vines, Lasse; Kuznetsov, Andrej Yu.; Svensson, Bengt G.; Du, Xiaolong; Tuomisto, Filip; Hallén, Anders (Journal article / Tidsskriftartikkel / PublishedVersion; Peer reviewed, 2009)
    The interaction between group-Ia elements in ZnO have been studied by implanting Na into hydrothermally grown ZnO samples containing ~4×1017 Li/cm3 and employing secondary ion mass spectrometry for sample analysis. ...
  • Neuvonen, Pekka T.; Vines, Lasse; Svensson, Bengt G.; Kuznetsov, Andrej Yu. (Journal article / Tidsskriftartikkel / AcceptedVersion; Peer reviewed, 2013)
    The role of excess intrinsic atoms for residual point defect balance has been discriminated by implanting Zn or O ions into Li-containing ZnO and monitoring Li redistribution and electric resistivity after post-implant ...
  • Neuvonen, Pekka T. (Doctoral thesis / Doktoravhandling, 2012)
    Within the last decade, zinc oxide has become the second most published semiconductor right after Si. The popularity of ZnO is explained by its optical and electrical properties. It is highly desired for optoelectronic ...